By Richard H. Vollmerhausen
Advances in strong kingdom detector arrays, flat panel screens, and electronic photo processing have caused an expanding number of sampled imaging items and probabilities. those expertise advancements offer new possibilities and difficulties for the layout engineer and method analyst--this tutorial's meant reader.
- Fourier imperative illustration of an optical image
- Sampled imager reaction function
- Sampled imager layout and optimization
- Interlace and Dither
- Dynamic Sampling, answer Enhancement, and Super-Resolution
- The Sampling Theorem
- Laboratory Measurements of Sampled Infrared Imaging method Performance
- Appendix A: Fourier integrals and Fourier series
- Appendix B: The impulse function
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Additional info for Analysis of Sampled Imaging Systems (SPIE Tutorial Texts in Optical Engineering Vol. TT39)
This image blurring is in addition to the spatial integration of the detector itself. It is important to note that this additional blurring does not occur for staring sensors, because the scene is not scanned across the staring array during the integration of the photo-signal. The scan direction is assumed to be the horizontal or x direction. Usually, the distance in milliradians between samples is smaller than the detector angular subtense (the instantaneous field of view) by a factor called samples per DAS or samples per IFOV, ϑ .
We have defined another term for the aliased response because using the word aliasing to represent the entire spurious spectrum which results from sampling would be confusing to many readers. It has become common practice among engineers to use the term “aliasing” to refer only to overlap in the frequency domain between the sample generated replica spectra and the baseband spectrum. Ideally, aliasing which does not overlap the baseband spectrum [does not overlap F(ξ)] can be removed by postsample filtering.
In older sensors, the analog detector outputs were amplified and then processed in various ways to construct the displayed image. In most modern parallel scan imagers, circuitry on the detector focal plane integrates the photoelectron signal for a sample time period. At the end of the sample period, the integrator voltage is read out by a sample and hold circuit. The integrator is then reset in preparation for the next sample. The detector sample and hold function is an integration of the detector photoelectron signal as the scene is scanned across the detector array.